Nano-steganography using atomic force microscopy

Kudělka, Josef; Martínek, Tomáš; Navrátil, Milan; Křesálek, Vojtěch

dc.title	Nano-steganography using atomic force microscopy	en
dc.contributor.author	Kudělka, Josef
dc.contributor.author	Martínek, Tomáš
dc.contributor.author	Navrátil, Milan
dc.contributor.author	Křesálek, Vojtěch
dc.relation.ispartof	16th International Conference on Nanotechnology - IEEE NANO 2016
dc.identifier.isbn	9781509039142
dc.date.issued	2016
dc.citation.spage	157
dc.citation.epage	159
dc.event.title	16th IEEE International Conference on Nanotechnology - IEEE NANO 2016
dc.event.location	Sendai
utb.event.state-en	Japan
utb.event.state-cs	Japonsko
dc.event.sdate	2016-08-22
dc.event.edate	2016-08-25
dc.type	conferenceObject
dc.language.iso	en
dc.publisher	Institute of Electrical and Electronics Engineers (IEEE)
dc.identifier.doi	10.1109/NANO.2016.7751451
dc.relation.uri	http://ieeexplore.ieee.org/document/7751451/
dc.description.abstract	This paper presents physical nano-steganography for secret data transmission. The experimental code was engraved into the base polycarbonate plastic layer of a compact disc by atomic force microscopy nanolithography. The advantage is that such information cannot be found using optical microscopes and it is very problematic to find it even by the most of electron microscopes due to the subtle variations in height. © 2016 IEEE.	en
utb.faculty	Faculty of Applied Informatics
dc.identifier.uri	http://hdl.handle.net/10563/1006958
utb.identifier.obdid	43875779
utb.identifier.scopus	2-s2.0-85006919162
utb.identifier.wok	000391840000045
utb.source	d-scopus
dc.date.accessioned	2017-07-13T14:50:26Z
dc.date.available	2017-07-13T14:50:26Z
dc.description.sponsorship	Ministry of Education; Youth and Sports of the Czech Republic within the National Sustainability Programme [LO1303, MSMT-7778/2014]
utb.contributor.internalauthor	Kudělka, Josef
utb.contributor.internalauthor	Martínek, Tomáš
utb.contributor.internalauthor	Navrátil, Milan
utb.contributor.internalauthor	Křesálek, Vojtěch
utb.fulltext.affiliation	Josef Kudelka, Tomas Martinek, Milan Navratil, Vojtech Kresalek All authors are with Department of Electronics and Measurement Faculty of Applied Informatics, Tomas Bata University in Zlin. Nad Stranemi 4511, 760 05 Zlin, Czech Republic (corresponding author's e-mail: kudelka@fai.utb.cz).
utb.fulltext.dates	-
utb.fulltext.sponsorship	This work was supported by the Ministry of Education, Youth and Sports of the Czech Republic within the National Sustainability Programme project No. LO1303 (MSMT-7778/2014).