Publikace UTB
Repozitář publikační činnosti UTB

Raman spectroscopic study of counterfeit electronic components

Repozitář DSpace/Manakin

Zobrazit minimální záznam


dc.title Raman spectroscopic study of counterfeit electronic components en
dc.contributor.author Vašková, Hana
dc.contributor.author Neumann, Petr
dc.contributor.author Kozubík, Mikuláš
dc.contributor.author Jelínek, Karel
dc.relation.ispartof WSEAS Transactions on Systems and Control
dc.identifier.issn 1991-8763 Scopus Sources, Sherpa/RoMEO, JCR
dc.date.issued 2018
utb.relation.volume 13
dc.citation.spage 453
dc.citation.epage 459
dc.type article
dc.language.iso en
dc.publisher World Scientific and Engineering Academy and Society (WSEAS)
dc.subject Authenticity assessment en
dc.subject Components en
dc.subject Counterfeit en
dc.subject Electronic en
dc.subject Non-destructive en
dc.subject Raman spectroscopy en
dc.description.abstract The paper deals with the potential of Raman spectroscopy as an analytical method for the authenticity assessment of electronic components. Electronic components are an integral part of the devices that people use in their daily activities. Incidence of counterfeit electronic components is an increasingly common phenomenon in our modern world that may compromise reliability, functionality and other related purposes of the devices. As the Raman spectroscopy provides detailed information on the material used, the focus of the Raman spectroscopic study of selected original components was given especially on materials of polymer-based and ceramic-based packages and markings. Knowledge of this information can help to distinguish between genuine and counterfeit component. The non-original component was revealed using other methods used in our workplace. Raman spectroscopy also confirmed the differences in materials of counterfeits compared to the original. © 2018, World Scientific and Engineering Academy and Society. All rights reserved. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1008490
utb.identifier.obdid 43879900
utb.identifier.scopus 2-s2.0-85061292636
utb.source j-scopus
dc.date.accessioned 2019-07-08T11:59:51Z
dc.date.available 2019-07-08T11:59:51Z
dc.rights Attribution 4.0 International
dc.rights.uri https://creativecommons.org/licenses/by/4.0/
dc.rights.access openAccess
utb.contributor.internalauthor Vašková, Hana
utb.contributor.internalauthor Neumann, Petr
utb.contributor.internalauthor Kozubík, Mikuláš
utb.contributor.internalauthor Jelínek, Karel
utb.fulltext.affiliation HANA VASKOVA, PETR NEUMANN, MIKULAS KOZUBIK, KAREL JELINEK Department of Electronic and Measurements Tomas Bata University in Zlin Namesti T.G.M. 5555, Zlin, 760 01 Address (12pt Times New Roman, centered) CZECH REPUBLIC vaskova@fai.utb.cz http://www.utb.cz
utb.fulltext.dates -
utb.scopus.affiliation Department of Electronic and Measurements Tomas, Bata University in Zlin, Namesti T.G.M. 5555, 12pt Times New Roman, centered, Zlin, 760 01, Czech Republic
utb.fulltext.faculty Faculty of Applied Informatics
utb.fulltext.faculty Faculty of Applied Informatics
utb.fulltext.faculty Faculty of Applied Informatics
utb.fulltext.faculty Faculty of Applied Informatics
utb.fulltext.ou Department of Electronics and Measurements
utb.fulltext.ou Department of Electronics and Measurements
utb.fulltext.ou Department of Electronics and Measurements
utb.fulltext.ou Department of Electronics and Measurements
Find Full text

Soubory tohoto záznamu

Zobrazit minimální záznam

Attribution 4.0 International Kromě případů, kde je uvedeno jinak, licence tohoto záznamu je Attribution 4.0 International