Kontaktujte nás | Jazyk: čeština English
dc.title | Patterning of self-assembled monolayers (SAMS) | en |
dc.contributor.author | Urbánek, Michal | |
dc.contributor.author | Urbánek, Pavel | |
dc.contributor.author | Machovský, Michal | |
dc.contributor.author | Kuřitka, Ivo | |
dc.relation.ispartof | NANOCON Conference Proceedings - International Conference on Nanomaterials | |
dc.identifier.issn | 2694-930X Scopus Sources, Sherpa/RoMEO, JCR | |
dc.identifier.isbn | 978-80-87294-95-6 | |
dc.date.issued | 2020 | |
utb.relation.volume | 2020-October | |
dc.citation.spage | 648 | |
dc.citation.epage | 652 | |
dc.event.title | 11th International Conference on Nanomaterials - Research and Application, NANOCON 2019 | |
dc.event.location | Brno | |
utb.event.state-en | Czech Republic | |
utb.event.state-cs | Česká republika | |
dc.event.sdate | 2019-10-16 | |
dc.event.edate | 2019-10-18 | |
dc.type | conferenceObject | |
dc.language.iso | en | |
dc.publisher | TANGER Ltd. | |
dc.identifier.doi | 10.37904/nanocon.2019.8592 | |
dc.relation.uri | https://www.confer.cz/nanocon/2019/107-patterning-of-self-assembled-monolayers-sams | |
dc.subject | self-assembled monolayers | en |
dc.subject | photolithography | en |
dc.subject | SEM | en |
dc.subject | AFM | en |
dc.subject | FTIR | en |
dc.subject | magnetron sputtering | en |
dc.description.abstract | Self-assembled monolayers (SAMs) has recently received much attention because of their wide range in applications such as layers in biosensors, electronic active layers or interlayers in organic electronic devices like organic light emitting diodes (OLEDs), organic photovoltaics (OPVs), organic thin film transistors (OTFTs). Photolithography is a basic and long established technique used in the preparation of processors and other electronic components. This paper deals with patterning of self-assembled monolayers prepared on gold and silver layers using photolithography. Firstly, the prepared self-assembled monolayers were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM) and Fourier-transform infrared spectroscopy (FTIR). Subsequently testing patterns according to the resolution chart test were exposed by UV lithography. These prepared patterns were characterized by optical microscopy, atomic force microscopy (AFM) and scanning electron microscopy (SEM). © NANOCON 2019.All right reserved. | en |
utb.faculty | University Institute | |
dc.identifier.uri | http://hdl.handle.net/10563/1010084 | |
utb.identifier.obdid | 43881844 | |
utb.identifier.scopus | 2-s2.0-85097171543 | |
utb.identifier.wok | 000664115400111 | |
utb.source | d-scopus | |
dc.date.accessioned | 2020-12-22T08:40:37Z | |
dc.date.available | 2020-12-22T08:40:37Z | |
dc.description.sponsorship | Ministry of Education, Youth and Sports of the Czech Republic Program NPU I [LO1504]; Operational Program Research and Development for Innovations - European Regional Development Fund (ERDF); national budget of the Czech Republic [CZ.1.05/2.1.00/19.0409] | |
dc.rights | Attribution 4.0 International | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.rights.access | openAccess | |
utb.ou | Centre of Polymer Systems | |
utb.contributor.internalauthor | Urbánek, Michal | |
utb.contributor.internalauthor | Urbánek, Pavel | |
utb.contributor.internalauthor | Machovský, Michal | |
utb.contributor.internalauthor | Kuřitka, Ivo | |
utb.fulltext.affiliation | Michal URBÁNEK, Pavel URBÁNEK, Michal MACHOVSKÝ, Ivo KUŘITKA Centre of Polymer Systems, Tomas Bata University in Zlin, Czech Republic, EU, murbanek@utb.cz | |
utb.fulltext.dates | - | |
utb.fulltext.sponsorship | This work was supported by the Ministry of Education, Youth and Sports of the Czech Republic - Program NPU I (LO1504). This article was written with the support of Operational Program Research and Development for Innovations co-funded by the European Regional Development Fund (ERDF) and national budget of the Czech Republic, within the framework of the project CPS - strengthening research capacity (reg. number: CZ.1.05/2.1.00/19.0409). | |
utb.wos.affiliation | [Urbanek, Michal; Urbanek, Pavel; Machovsky, Michal; Kuritka, Ivo] Tomas Bata Univ Zlin, Ctr Polymer Syst, Zlin, Czech Republic | |
utb.scopus.affiliation | Centre of Polymer Systems, Tomas Bata University, Zlin, Czech Republic | |
utb.fulltext.projects | LO1504 | |
utb.fulltext.projects | CZ.1.05/2.1.00/19.0409 | |
utb.fulltext.faculty | University Institute | |
utb.fulltext.faculty | University Institute | |
utb.fulltext.faculty | University Institute | |
utb.fulltext.faculty | University Institute | |
utb.fulltext.ou | Centre of Polymer Systems | |
utb.fulltext.ou | Centre of Polymer Systems | |
utb.fulltext.ou | Centre of Polymer Systems | |
utb.fulltext.ou | Centre of Polymer Systems |