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Optical properties of thin tungsten films

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dc.title Optical properties of thin tungsten films en
dc.contributor.author Martínek, Tomáš
dc.relation.ispartof Proceedings - 26th International Conference on Circuits, Systems, Communications and Computers, CSCC 2022
dc.identifier.isbn 978-1-6654-8186-1
dc.date.issued 2022
dc.citation.spage 20
dc.citation.epage 22
dc.event.title 26th International Conference on Circuits, Systems, Communications and Computers, CSCC 2022
dc.event.location Chania, Crete Island
utb.event.state-en Greece
utb.event.state-cs Řecko
dc.event.sdate 2022-07-19
dc.event.edate 2022-07-22
dc.type conferenceObject
dc.language.iso en
dc.publisher Institute of Electrical and Electronics Engineers Inc.
dc.identifier.doi 10.1109/CSCC55931.2022.00013
dc.relation.uri https://ieeexplore.ieee.org/document/10017525
dc.relation.uri https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10017525
dc.subject absorbance en
dc.subject Atomic force microscopy en
dc.subject diagnostic en
dc.subject optical properties en
dc.subject transmittance en
dc.subject tungsten en
dc.description.abstract In this work optical properties of thin tungsten films deposited by radiofrequency magnetron sputtering close to insulator-conductor transition were investigated for their potential use in optoelectronics. These films were deposited on a V1 mica substrate. An atomic force microscopy topographical maps, optical absorbance measured on a spectrophotometer, and optical transmittance results were reported. © 2022 IEEE. en
utb.faculty Faculty of Applied Informatics
dc.identifier.uri http://hdl.handle.net/10563/1011398
utb.identifier.obdid 43883669
utb.identifier.scopus 2-s2.0-85147735527
utb.source d-scopus
dc.date.accessioned 2023-02-25T13:54:24Z
dc.date.available 2023-02-25T13:54:24Z
utb.ou Department of Electronics and Measurements
utb.contributor.internalauthor Martínek, Tomáš
utb.fulltext.sponsorship This work was supported by the project Technical Sciences for Safe Society – Electromagnetic Compatibility in Security Applications.
utb.scopus.affiliation Tomas Bata University in Zlín, Faculty of Applied Informatics, Dept. of Electronics and Measurements, Zlín, Czech Republic
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