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Optical properties of thin tungsten films
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| dc.title | Optical properties of thin tungsten films | en |
| dc.contributor.author | Martínek, Tomáš | |
| dc.relation.ispartof | Proceedings - 26th International Conference on Circuits, Systems, Communications and Computers, CSCC 2022 | |
| dc.identifier.isbn | 978-1-6654-8186-1 | |
| dc.date.issued | 2022 | |
| dc.citation.spage | 20 | |
| dc.citation.epage | 22 | |
| dc.event.title | 26th International Conference on Circuits, Systems, Communications and Computers, CSCC 2022 | |
| dc.event.location | Chania, Crete Island | |
| utb.event.state-en | Greece | |
| utb.event.state-cs | Řecko | |
| dc.event.sdate | 2022-07-19 | |
| dc.event.edate | 2022-07-22 | |
| dc.type | conferenceObject | |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | |
| dc.identifier.doi | 10.1109/CSCC55931.2022.00013 | |
| dc.relation.uri | https://ieeexplore.ieee.org/document/10017525 | |
| dc.relation.uri | https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10017525 | |
| dc.subject | absorbance | en |
| dc.subject | Atomic force microscopy | en |
| dc.subject | diagnostic | en |
| dc.subject | optical properties | en |
| dc.subject | transmittance | en |
| dc.subject | tungsten | en |
| dc.description.abstract | In this work optical properties of thin tungsten films deposited by radiofrequency magnetron sputtering close to insulator-conductor transition were investigated for their potential use in optoelectronics. These films were deposited on a V1 mica substrate. An atomic force microscopy topographical maps, optical absorbance measured on a spectrophotometer, and optical transmittance results were reported. © 2022 IEEE. | en |
| utb.faculty | Faculty of Applied Informatics | |
| dc.identifier.uri | http://hdl.handle.net/10563/1011398 | |
| utb.identifier.obdid | 43883669 | |
| utb.identifier.scopus | 2-s2.0-85147735527 | |
| utb.source | d-scopus | |
| dc.date.accessioned | 2023-02-25T13:54:24Z | |
| dc.date.available | 2023-02-25T13:54:24Z | |
| utb.ou | Department of Electronics and Measurements | |
| utb.contributor.internalauthor | Martínek, Tomáš | |
| utb.fulltext.sponsorship | This work was supported by the project Technical Sciences for Safe Society – Electromagnetic Compatibility in Security Applications. | |
| utb.scopus.affiliation | Tomas Bata University in Zlín, Faculty of Applied Informatics, Dept. of Electronics and Measurements, Zlín, Czech Republic |
