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Title: | Specifications of measuring probes in the near zone of mechatronic systems |
Author: | Ivanka, Ján |
Document type: | Conference paper (English) |
Source document: | EAN 2012: Proceedings of the 50th Annual Conference on Experimental Stress Analysis. 2012, p. 38-43 |
ISBN: | 9788001050606 |
Abstract: | This report brings you the essential knowledge and findings regarding the measurement of microwave antenna parameters in the near zone mechatronic systems. The goal of this report is to give you an overview of the advantages and disadvantages of the near zone measurement process and comparison with measurements performed in the distant zone. Probes with low gain offer advantages from a calculation point of view, because is often unnecessary to perform compensation of the probe during calculation. This is true mostly for cylindrical and spherical scanning (spherical scanning is even less sensitive to the probe influence then cylindrical scanning). Using probes with two orthogonally polarized signals, to ensure the scanning of two data files during one scan, will shorten the time by one half, which is necessary for data collection in comparison with traditional scanning with one output probe. This report gives you several typical samples of probes with one or two outputs for the reception of orthogonally polarized signals. Most samples apply to probes with low gain (approximately 7 dB). |
Full text: | http://toc.proceedings.com/22851webtoc.pdf |
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