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Title: | Influence of measurement conditions and used devices on consequential creep modulus | ||||||||||
Author: | Řezníček, Martin; Bednařík, Martin; Hýlová, Lenka; Maňas, David | ||||||||||
Document type: | Conference paper (English) | ||||||||||
Source document: | MATEC Web of Conferences 20th International Conference on Circuits, Systems, Communications and Computers (CSCC 2016). 2016, vol. 76 | ||||||||||
ISSN: | 2261-236X (Sherpa/RoMEO, JCR) | ||||||||||
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DOI: | https://doi.org/10.1051/matecconf/20167602025 | ||||||||||
Abstract: | This research deals with study of the possibilities of the creep properties measurement on dedicated devices for the creep measurement and on devices, which enable the creep properties measurement. A comparison of these two different measurement methods show the influence of boundary conditions on the measurement result. Simultaneously, the effort to shorten the long-term tests, because of time saving during research and development of new materials, is confronted here. Radiation crosslinking samples of high-density polyethylene (HDPE), which enable the change of the internal structure to the spatial network by the influence of beta radiation, were chosen as an example for comparison. | ||||||||||
Full text: | https://www.matec-conferences.org/articles/matecconf/abs/2016/39/matecconf_cscc2016_02025/matecconf_cscc2016_02025.html | ||||||||||
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