Electromagnetic compatibility of arduino development platform in near and far-field

Kovář, Stanislav; Mach, Václav; Valouch, Jan; Adámek, Milan

Název:

Autor:

Kovář, Stanislav; Mach, Václav; Valouch, Jan; Adámek, Milan

Typ dokumentu:

Recenzovaný odborný článek (English)

Zdrojový dok.:

International Journal of Applied Engineering Research. 2017, vol. 12, issue 15, p. 5047-5052

ISSN:

0973-4562 (Sherpa/RoMEO, JCR)

Journal Impact This chart shows the development of journal-level impact metrics in time

JCR	Journal Citation Reports - Impact Factor
SNIP	SCImago Source Normalized Impact per Paper
SJR	SCImago Journal Rank
IPP	SCImago Impact per Publication
CS	Scopus CiteScore

(Note: The metrics are not comparable against one another.)

Abstrakt:

The electromagnetic compatibility is a very popular scientific discipline that widely affects the electronic devices. The electromagnetic radiation can be associated with many distortion and errors in the microcontrollers. The main purpose of this article is to examine the EMC of a cheap development kit, namely Arduino. In addition, the article provides the comparison of the results in terms of electromagnetic susceptibility and interference. © 2017, Research India Publications. All rights reserved.

Plný text:

http://www.ripublication.com/ijaer17/ijaerv12n15_%20(45).pdf

Zobrazit celý záznam

Soubory tohoto záznamu

Název: Fulltext_1007461.pdf

Velikost: 617.4Kb

Formát: PDF

Popis: fulltext

Zobrazit/otevřít

Citace ČSN ISO 690:2011

Citace článku v časopise:
KOVÁŘ, Stanislav, Václav MACH, Jan VALOUCH a Milan ADÁMEK. Electromagnetic compatibility of arduino development platform in near and far-field. International Journal of Applied Engineering Research [online]. 2017, vol. 12, iss. 15, s. 5047-5052. [cit. 2024-11-22]. ISSN 0973-4562. Dostupné z: http://www.ripublication.com/ijaer17/ijaerv12n15_%20(45).pdf.

Tyto citace vytvořil software a mohou obsahovat chyby. Pro ověření přesnosti si nastudujte příslušnou citační normu nebo příručku.