Electromagnetic compatibility of arduino development platform in near and far-field

Kovář, Stanislav; Mach, Václav; Valouch, Jan; Adámek, Milan

Title:

Author:

Kovář, Stanislav; Mach, Václav; Valouch, Jan; Adámek, Milan

Document type:

Peer-reviewed article (English)

Source document:

International Journal of Applied Engineering Research. 2017, vol. 12, issue 15, p. 5047-5052

ISSN:

0973-4562 (Sherpa/RoMEO, JCR)

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Abstract:

The electromagnetic compatibility is a very popular scientific discipline that widely affects the electronic devices. The electromagnetic radiation can be associated with many distortion and errors in the microcontrollers. The main purpose of this article is to examine the EMC of a cheap development kit, namely Arduino. In addition, the article provides the comparison of the results in terms of electromagnetic susceptibility and interference. © 2017, Research India Publications. All rights reserved.

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http://www.ripublication.com/ijaer17/ijaerv12n15_%20(45).pdf

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Citace článku v časopise:
KOVÁŘ, Stanislav, Václav MACH, Jan VALOUCH a Milan ADÁMEK. Electromagnetic compatibility of arduino development platform in near and far-field. International Journal of Applied Engineering Research [online]. 2017, vol. 12, iss. 15, s. 5047-5052. [cit. 2024-11-22]. ISSN 0973-4562. Dostupné z: http://www.ripublication.com/ijaer17/ijaerv12n15_%20(45).pdf.

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